The excitation of cavity standing waves in double-slit structures in thin gold films, with slit lengths between 400 and 2560 nm, was probed with a strongly focused electron beam in a transmission electron microscope. The energies and wavelengths of cavity modes up to the 11th mode order were measured with electron energy loss spectroscopy to derive the corresponding dispersion relation. For all orders, a significant redshift of mode energies accompanied by a wavelength elongation relative to the expected resonator energies and wavelengths is observed.

We present numerical and analytical results for the lifetime of emitters in close proximity to graphene sheets. Specifically, we analyze the contributions from different physical channels that participate in the decay processes. Our results demonstrate that measuring the emitters' decay rates provides an efficient route for sensing graphene's optoelectronic properties, notably the existence and size of a potential band gap in its electronic band structure.